CU/CO METACONDUCTOR BASED COPLANAR WAVEGUIDE WITH SUB 0.1 DB/MM INSERTION LOSS AT 28 GHZ
Hae-in Kim, Renuka Bowrothu and Yong-Kyu Yoon
This paper reports a breakthrough result on a Cu/Co metaconductor based coplanar waveguide (CPW) with a substantially low insertion loss of 0.075 dB/mm at 28 GHz for the 5 th generation new radio (5G NR) interconnect applications. Based on the scalability study with fabricated 7, 10, and 20 pairs of Cu/Co nanolayered metaconductors on a glass substrate, the 20 paired one shows the lowest insertion loss, whose equivalent series resistance is 54 % lower than that of a solid Cu based counterpart in the frequency band of n257 (26.5-29.5 GHz).
Keywords: Metaconductor, interconnects, skin depth, 5G, millimeter wave, Packaging, conductor loss and dielectric loss